OMA-300-InGaAs Process Analyzer main view

OMA-300-InGaAs
Process Analyzer



The OMA-300-InGaAs uses an Indium Gallium Arsenide detector and can be configured to scan across in one of three wavelength ranges – 1350-1650nm, 1550-1850nm, & 1750-2150nm.

  • Continuously measures chemical concentrations in a liquid or gas process stream
  • Totally solid-state build with no moving parts — modern design for low maintenance
  • Ultra-safe fiber optic design with dedicated sample flow cell — no sample fluid in analyzer enclosure
  • Decades of field-proven performance in the world’s harshest industrial environments

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Applications: InGaAs Process Analyzer

The OMA-300-InGaAs Process Analyzer produces results in real time by measuring the light absorbance of a liquid or gas sample by utilizing the Beer-Lambert law to correlate the light data to the chemical concentration of an analyte. The OMA-300-InGaAs uses an Indium Gallium Arsenide detector and can be configured to scan across in one of three wavelength ranges – 1350-1650nm, 1550-1850nm, & 1750-2150nm.

These wavelengths are applicable for measurements such as moisture in solvents, moisture in propylene, ethylene concentration, pharmaceutical HPLC carrier solvents verification, acrolein purity for moisture and acetaldehyde and more .

Technology: InGaAs Process Analyzer

Principle of Operation

To analyze the chemical composition of the sample, the OMA performs infrared spectroscopy using an InGaAs (indium gallium arsenide) sensor. The system measures absorbance at 1350-1650nm, 1550-1850nm, & 1750-2150nm. and quantifies the amount of light absorbed by the sample; the OMA plots this raw data to visualize a high-resolution absorbance spectrum.

The OMA uses a long-life tungsten light source to transmit light through the sample fluid in the flow cell. The light is carried by fiber optic cables from the analyzer to the flow cell, where the chemical mixture of the sample has unique interactions with the light based on its current composition.

Optical Assembly of InGaAs Analyzer

OMA-300-InGaAs Internal Components

OMA-300-InGaAs Analyzer Internal Components

Sampling: InGaAs Process Analyzer

Wetted materials for the sample conditioning system include: SS316/316L, viton, PTFE, BK7 Glass.

Specifications: InGaAs Process Analyzer

Note: All performance specifications are subject to the assumption that the sample conditioning system and unit installation are approved by Applied Analytics. For any other arrangement, please inquire directly with Sales.

Measurement Principle InGaAs (indium gallium arsenide) infrared spectrometer
Detector SIGMA™ NIR Spectrometer
Spectral Range 1350-1650nm, 1550-1850nm or 1750-2150nm
Light Source Tungsten lamp
Light Transmission 600 μm core 1.8 meter fiber optic cables
Other lengths available
Path Length Application-dependent
Sample Introduction Sample Conditioning System
Wetted materials: SS316/316L, viton, PTFE, BK7 Glass
Analyzer Calibration Factory calibrated, if possible
Human Machine Interface Industrial controller with touch-screen LCD display running ECLIPSE™ Software
User Interface ECLIPSE™ Runtime Software
Data Storage Solid State Drive
OPERATING CONDITIONS
Analyzer Environment Indoor/Outdoor (no shelter required)
Ambient Temperature Standard: 0 to 35 °C
Optional: -40 to 60 °C
To avoid radiational heating, use of a sunshade is recommended for systems installed in direct sunlight.
Sample Temperature Range Standard: -20 to 70 °C (-4 to 158 °F)
Optional: up to 150 °C (302 °F) with cooling extensions
Contact AAI for temperatures above 150 °C (302 °F)
Sample Pressure 3000 psig
UTILITIES
Voltage 85 to 264 VAC, single phase
Power Consumption 45 watts
OUTPUTS
Standard Outputs 1x galvanically isolated 4-20mA analog output per measured analyte(up to 3; additional available by upgrade)
2x digital outputs for fault and SCS control
Optional Outputs Modbus TCP/IP; RS-232; RS-485; Fieldbus; Profibus; HART;
Standard Design General Purpose
Available Options ATEX, IECEx, EAC, PESO, JPN, KTL
Please inquire with your sales representative for additional certifications (CSA, FM etc.).

Resources: InGaAs Process Analyzer

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